FDive: Learning Relevance Models using Pattern-based Similarity Measures
Proceedings of IEEE Conference on Visual Analytics Science and Technology (VAST), pp. 69–80, 2019.
BibTeX:
@inproceedings{Dennig2019FDive,
author = {Dennig, Frederik L. and Polk, Tom and Lin, Zudi and Schreck, Tobias and Pfister, Hanspeter and Behrisch, Michael},
editor = {Chang, Remco and Keim, Daniel A. and Maciejewski, Ross},
title = {{FDive: Learning Relevance Models using Pattern-based Similarity Measures}},
booktitle = {Proceedings of {IEEE} Conference on Visual Analytics Science and Technology ({VAST})},
pages = {69--80},
publisher = {{IEEE}},
year = {2019},
doi = {10.1109/VAST47406.2019.8986940},
url = {https://ieeexplore.ieee.org/document/8986940}
}
